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Wednesday, May 13, 2020 | History

2 edition of Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1985 found in the catalog.

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1985

Electrical Overstress/Electrostatic Discharge Symposium (1985 Minneapolis, MN)

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1985

Minneapolis, MN, September 10, 11, 12, 1985

by Electrical Overstress/Electrostatic Discharge Symposium (1985 Minneapolis, MN)

  • 162 Want to read
  • 5 Currently reading

Published by EOS/ESD Association in Westmoreland, NY .
Written in English

    Subjects:
  • Electronic apparatus and appliances -- Protection -- Congresses,
  • Electric discharges -- Congresses,
  • Electrostatics -- Congresses

  • Edition Notes

    Other titlesEOS/ESD Symposium proceedings
    Statementsponsored by The EOS/ESD Assoaciation and IIT Research Institute.
    ContributionsIIT Research Institute., Reliability Analysis Center (U.S.)
    Classifications
    LC ClassificationsTK7870 .E43 1985
    The Physical Object
    Paginationvii, 197 p. :
    Number of Pages197
    ID Numbers
    Open LibraryOL19529321M

    Symposium Proceedings From to " to provide ready access to current information on EOS/ESD-related topics. Containing indexes plus users' guide material, this document serves as a reference to aid in the utilization of information concerning all aspects of electrical overstress/electrostatic discharge as presented inAuthor: R E Rash, R T Wanner. Composite materials are traditionally designed for use as structural materials. With the rapid growth of the electronics industry, composite materials are finding more and more electronic by: 4.

      This work presents the design of a novel static-triggered power-rail electrostatic discharge (ESD) clamp circuit. The superior transient-noise immunity of the static ESD detection mechanism over the transient one is firstly discussed. Based on the discussion, a novel power-rail ESD clamp circuit utilizing the static ESD detection mechanism is by: 2. ESD Protection for Mixed-Voltage I/O Using NMOS Transistors Stacked in a Cascode Configuration - Electrical Overstress/Electrostatic Discharge S ymposium Proceedings, Author: IEEE Created Date: 2/25/ AM.

    T. Maloney and N. Khurana, ``Transmission line pulsing techniques for circuit modeling,'' in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, pp. , The EOS/ESD Symposium is focused on discussing the issues and providing the answers to electrostatic discharge in electronic production and assembly. Gain beneficial electrostatic knowledge Learn solutions to electrostatic issues and obstacles Discover new and emerging technologies Network with ESD professionals Develop valuable peer and industry contacts Sponsored by EOS/ESD Association Co.


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